Photon-Emission-Guided Laser Fault Injection Enables RP2350 Secure Debug
Researchers have introduced a photon‑emission‑guided laser fault‑injection technique that enhances secure debugging on the RP2350 microcontroller. By directing laser pulses based on emitted photons, the method can precisely target vulnerable circuits, allowing developers to observe and analyze internal states without exposing the device to traditional fault‑injection attacks. This approach promises stronger security while maintaining debugging flexibility.